The three basic assumptions are:
- Failure mechanisms (known and yet unknown) are families of macro effects, originating from basic physical 'micro phenomena', which are intrinsic to the basic material used in constructing an IC.
- These micro behaviors can be identified by measurements of electrical factors (current, voltage, frequency, etc.) using Electrical Testers.
- The technology is based on a theory that there are differences between one component and another due to minor changes in the production lines, or differences in the material that was used to produce them. By using electrical tests (measured by the A.T.E equipment), one can identify the suspected "weak" components, those components that are suspected to fail in real life operation.