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Laurieholdenwebsite has pioneered a uniqe method of sophisticated electrical testing to identify Integrated Circuits (IC) that would develop reliability problems during field operation.

Rapidly increasing complexity in microelectronic components, combined with high- density packaging technologies, has made it difficult and expensive to comprehensively test electronic systems and to diagnose failed parts using established methods. Industry forecasters warn that the situation will intensify as designers increase their use of embedded cores. As a results, new testing technologies must be developed if the industry is to continue the 30% per-year, per-function cost, reduction trend.

Recognizing the limitations of today's reliability testing methods, Laurieholdenwebsite has developed its LHWS-100 testing software product which allows semiconductor manufacturers to effectively and affordably test every chip online for latent physical defects which could cause infant mortality. The result is greater product reliability in an era of increasing technological complexity and decreasing device geometries, as well as faster time-to-market and faster yield learning for new products. This translates into cost savings worth millions of dollars to the chipmaker.

Laurieholdenwebsite's core technology is rooted in a series of state-of-the-art mathematical and statistical algorithms which measure electrical factors such as current, voltage, and frequency during a series of short electrical tests applied to each component. Based on these measurements, the LHWS-100 algorithms identify differences between components which arise from minor changes in the production line or variations in the material that was used to produce them. It is these slight physical defects which can cause infant mortality, or failure early in the chip's operating life. Chips identified by LHWS-100 as defective can be removed from the production line, thereby ensuring the integrity of units shipped out of the fab.

LHWS-100's online reliability testing capabilities reduce or eliminate, the need for burn-in - which is the most prevalent method of reliability testing in the industry today. Burn-in is a lengthy process in which integrated circuits are placed in special furnaces and subjected to controlled stresses to determine their reliability status. Because of its enormous time requirements, burn-in creates a severe bottleneck which delays time-to-market for new products.


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